TY - JOUR AU - Семенов, А.О. AU - Семенова, О.О. AU - Чухов, В.В. PY - 2011/06/01 Y2 - 2024/03/28 TI - Sensitivity analysis of the phase angle of the reflection coefficient of waveguide measurement cell in the case of low loss dielectric JF - Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia JA - RADAP VL - 0 IS - 45 SE - DO - 10.20535/RADAP.2011.45.130-139 UR - https://radap.kpi.ua/radiotechnique/article/view/220 SP - 130-139 AB - In problem for rectangular waveguide segment with dielectric layer parameters measurement we must analyze sensitivity these parameters to changes some influencing values, like segment length, wavelength and specimen dielectric permittivity. Analyze module and phase angle of reflection coefficient sensitivity for dielectric without loss and analyze module and phase angle of reflection and transmission coefficients sensitivity for low loss dielectric are made at present day. But we must know reflection coefficient phase angle sensitivity of waveguide measurement cell in case of low loss dielectric in some applied problems. In article this problem is solved by help of sensitivity coefficients. Analytical formulas for these coefficients are obtained and their frequency dependencies for segment length and complex dielectric permittivity changes are analyzed also. Measurements at resonant frequencies appropriateness are certified. But we obtain more accuracy, when we use longer specimen than shorter specimen, and specimen length is limited by measurement devices sensitivity even so. ER -