TY - JOUR
AU - Достал, Т.
AU - Сушко, І.О.
AU - Мацай, А.О.
AU - Гайдаєнко, Є.В.
AU - Рибін, О.І.
PY - 2014/04/03
Y2 - 2024/10/03
TI - Sensitivity of phantom contour voltage to complex impedance changes of inhomogeneities in Electrical Impedance Tomography
JF - Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia
JA - RADAP
VL - 0
IS - 56
SE -
DO - 10.20535/RADAP.2014.56.152-164
UR - https://radap.kpi.ua/radiotechnique/article/view/756
SP - 152-164
AB - <span style="text-decoration: underline;">Introduction</span>. The analysis of surface conductivity influence of inhomogeneities to the changes of complex phantom contour voltages comparing with a homogeneous phantom with complex surface conductivity is carried out. The analysis of the influence of finite element and all phantom generally anisotropy on the calculated complex voltages is conducted.<br /> <span style="text-decoration: underline;">The results</span>. The model of square finite element is obtained. It consists of 1024х1024 finite elements obtained by simplified approximate formulas. The relative increments of voltage values are unchanged regardless of the difference in the absolute values of voltages measured at different positions of the current source. It is proposed to rotate the phantom grids of finite elements and conductivity zones with the current source rotation to overcome this anisotropy.<br /> <span style="text-decoration: underline;">Conclusions</span>. Final conclusions about the limits of the measuring device sensitivity could be done only after the data accumulation of solving the inverse problem by zones conductivity method.
ER -