Биткін , С.В. and Критська , Т.В. 2023. Radiation Resistance of Test npn IC Transistors with Dielectric Insulation, Manufactured on Silicon, Isovalently Doped with Germanium (SiGe). Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia. 91 (Mar. 2023), 72-78. DOI:https://doi.org/10.20535/RADAP.2023.91.72-78.