Engineering of refraction index profile of planar metal-dielectric waveguide. Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, [S. l.], n. 40, p. 108–112, 2010. DOI: 10.20535/RADAP.2010.40.108-112. Disponível em: https://radap.kpi.ua/radiotechnique/article/view/619. Acesso em: 14 mar. 2025.