Sensitivity analysis of the phase angle of the reflection coefficient of waveguide measurement cell in the case of low loss dielectric. Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, [S. l.], n. 45, p. 130–139, 2011. DOI: 10.20535/RADAP.2011.45.130-139. Disponível em: https://radap.kpi.ua/radiotechnique/article/view/220. Acesso em: 12 jul. 2025.