КИЧАК , В. М.; СЛОБОДЯН , І. В.; ВОВК , В. Л. Radiation-Resistant Memory Device Based on Chalcogenide Glassy Semiconductor. Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, [S. l.], n. 80, p. 79-84, 2020. DOI: 10.20535/RADAP.2020.80.79-84. Disponível em: https://radap.kpi.ua/radiotechnique/article/view/1626. Acesso em: 23 jul. 2024.