ЗИЛЕВІЧ, М. О.; КУЧЕРНЮК, П. В. An Empirical Model of the Silicon Bandgap Dependence on the External Pressure. Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, [S. l.], n. 85, p. 60-68, 2021. DOI: 10.20535/RADAP.2021.85.60-68. Disponível em: https://radap.kpi.ua/radiotechnique/article/view/1720. Acesso em: 21 nov. 2024.