Determination of reliability parameters of radioelectronic devices determined by thermal modes. Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, [S. l.], n. 57, p. 92–103, 2014. DOI: 10.20535/RADAP.2014.57.92-103. Disponível em: https://radap.kpi.ua/radiotechnique/article/view/791. Acesso em: 3 apr. 2025.