Determination of reliability parameters of radioelectronic devices determined by thermal modes

Authors

  • A. V. Nikitchuk National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"
  • B. M. Uvarov National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute" http://orcid.org/0000-0003-3375-6181

DOI:

https://doi.org/10.20535/RADAP.2014.57.92-103

Keywords:

reliability, RED, failure, microassembly, thermal field, heat, failure rate, reliability particular, automation, reliability calculation

Abstract

Statement of the problem. The reliability is important (and sometimes crucial) functional characteristic for RED. So it is necessary to analyze the impact on them of destabilizing external factors - mechanical, temperature, humidity, ionizing radiation.
Structural-design elements RED. SCM are the main objects for which you first need to determine the temperature of the ЕЕS and performance reliability.
Determination of the temperature of the EES cells and microassemblies. The basic mathematical models are presented to determine the temperatures of the electronic structure elements of cells and microassemblies.
Indicators of HEE reliability as a function of their temperature. The value of the operational failure rate of most groups RED calculated by mathematical models. These indicators include: basic failure rate, the rate regime, the coefficients that take into account changes in operational failure rate depending on various factors.
Software definition of reliability parameters. The software product allows you to switch from "manual" calculation reliability REDs to a fully automated modeling components. The program is applicable for calculating the reliability and to find a more "sustainable" elements to increase the probability of failure-free operation.
Conclusions. Primary tasks performed in the work are listed

Author Biographies

A. V. Nikitchuk, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Postgraduate student

B. M. Uvarov, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Uvarov B. M., Doc. of Sci. (Techn.), Prof.

References

Перелік посилань

Вироби електронної техніки. Методи розрахунку надійності : ДСТУ 2992-95. – К. : Держстандарт України. – 77 с. – (Національні стандарти України).

Надежность электрорадиоизделий / С.Ф. Прытков, В.М. Горбачева, М.Н. Мартынова, Г.А. Петров. – МО РФ и НИИ «Электронстандарт», 2004. – 620 с.

Уваров Б.М. Автоматизація визначення показників механічної витривалості, теплових режимів та надійності радіоелектронних апаратів [Електронний ресурс] / Б.М. Уваров. – К. : НТУУ “КПІ“, 2013. – 111 с.

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Беляев Н.М. Методы теории теплопроводности / Н.М. Беляев, А.А. Рядно. – М. : Высшая школа, 1982. – 327 с.

References

DSTU 2992-95. (1996) Vyroby elektronnoi tekhniky. Metody rozrakhunku nadiinosti [State Standard 2992-95. Electronics products. Methods of calculation of reliability]. Kyiv, 77 p.

Prytkov S.F., Horbacheva V.M., Martynova M.N. and Petrov H.A. (2004) Nadezhnost elektroradyoyzdelyi [The reliability of radio electronic products]. Moscow, NII «Elektronstandart»,. 620 p.

Uvarov B.M. Avtomatizatsiia vyznachennja pokaznykiv mekhanichnoji vytryvalosti, teplovykh rezhymiv ta nadijnosti radioelektronnykh aparativ [Automation of determination of mechanical endurance, thermal modes and reliability of radioelectronic devices]. Kyiv, NTUU ”KPI”, 2013. 111 p.

Lykov A.V. (1978) Teplomassoobmen [Heat and Mass Transfer]. Moscow, Energiya Publ., 480 p.

Belyaev N.M. and Ryadno A.A. (1982) Metody teorii teploprovodnosti [Methods of the theory of heat conduction]. Moscow, Vysshaya shkola Publ., 327 p.

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Published

2014-06-30

How to Cite

Нікітчук, А. and Уваров, Б. (2014) “Determination of reliability parameters of radioelectronic devices determined by thermal modes”, Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, 0(57), pp. 92-103. doi: 10.20535/RADAP.2014.57.92-103.

Issue

No. 57 (2014)

Section

Designing of Radio Equipment

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