Оцінка основних характеристик ПЗЗ-матриць

O. S. Neuimin; S. M. Dyachenko

doi:10.20535/RADAP.2011.47.142-148

An assessment of the main CCD characteristics

Authors

O. S. Neuimin National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev http://orcid.org/0000-0001-5372-8474
S. M. Dyachenko National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

DOI:

https://doi.org/10.20535/RADAP.2011.47.142-148

Keywords:

CCD, nonuniformity, defect pixels, Modulation Transfer Function, dark frame subtraction, test pattern

Abstract

The influence of nonuniformity of the CCD elements on the output signal and how to fix it are considered. Using computer software ImageJ technique of the dark frame subtraction is implemented, which provides positive results in improved image. A method of forming test pattern on the computer monitor for the experimental measurement of modulation transfer function of CCD is proposed. Provides practical and theoretical results MTF. An explanation of the obtained results are presented.

Author Biographies

O. S. Neuimin, National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

Неуймін О.С., аспірант радіотехнічного факультету

S. M. Dyachenko, National Technical University of Ukraine, Kyiv Politechnic Institute, Kiev

Дяченко С.М., к.т.н., доц. кафедри радіотехнічних пристроїв та систем

References

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ImageJ. Image Processing and Analysis in Java. [Online] // National Institutes of Health. - Available from: http://rsbweb.nih.gov/ij/index.html (viewed 2011).

Hu J. Measurement of modulation transfer function of charge-coupled devices using frequency-variable sine grating patterns / Jiasheng Hu, Min Song, Yi Sun, Yefang Li // Applied Optical Engineering. – 1999. – Vol. 38. – No.7. – pp.1200–1204.

Quick MTF - приложение для тестирования изображений. [Электронный ресурс]// Quick MTF. – Текст. Программа. - 2011. – Режим доступа: http://ru.quickmtf.com/.

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How to Cite

Неуймін, О. and Дяченко, С. (2011) “An assessment of the main CCD characteristics”, Visnyk NTUU KPI Seriia - Radiotekhnika Radioaparatobuduvannia, 0(47), pp. 142-148. doi: 10.20535/RADAP.2011.47.142-148.

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Issue

No. 47 (2011)

Section

Functional Electronics. Micro- and Nanoelectronic Technology

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