Response time of measuring device at fluctuating noise

Authors

  • N. M. Malyarevskii Kiev Politechnic Institute, Kiev
  • P. A. Batrak Kiev Politechnic Institute, Kiev
  • A. N. Tkalya Kiev Politechnic Institute, Kiev

Keywords:

fluctuation noise, response time of measuring device, measuring circuit, precise radiomeasuring devices

Abstract

The estimation of the time of establishing the level meter in conditions of fluctuating noise origin. These relations establish a relationship with the time required to establish the parameters of the measuring path, his immunity and the required measurement accuracy. The results can be applied in the design of precision of radio devices.

Author Biographies

N. M. Malyarevskii, Kiev Politechnic Institute, Kiev

Malyarevskii N. M.

P. A. Batrak, Kiev Politechnic Institute, Kiev

Batrak P. A.

A. N. Tkalya, Kiev Politechnic Institute, Kiev

Tkalya A. N.

References

Гаткин Н. Г., Геранин В. А., Карновский М. И. и др. Помехоустойчивость типового тракта обнаружения сигналов. К. : Техніка, 1971. 203 с.

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Issue

No. 25 (1988)

Section

Articles