The reliability parameters definition in radioelectronic devices automated designing systems
DOI:
https://doi.org/10.20535/RADAP.2012.50.36-46Keywords:
thermal mode calculation, block, cell, microassembly, mathematical model, reliability indexAbstract
The reliability parameters calculating problems for radioelectronic devices determined by thermal modes are considered. It is shown that such calculations should be based on temperature definition methods for separate components of radio engineering device (RED) electronic structure. The thermal modes calculating methods for electronic blocks, cells, microassemblies are considered. The analytical models may be used for the average temperatures of cells in the block; the heat exchange equations system is proposed for radio component temperature estimation on the cell plate; the analytical solution is offered for microassembly temperature estimation. The analytical mathematical models for reliability indexes calculations of radio components and whole RED are determined.
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